A wide range of spectroscopic and microscopic techniques are available in ISOF to perform studies in different fields, studying the surface of materials from the nanometer to the millimeter scale, structures of biomolecules such as proteins, the molecular interactions, etc. Besides studying the structure of materials, we can correlate such structure with electric or optical properties of the materials, measuring as example the surface potential of charged objects at the nanoscale, the electrical conductivity with pA sensitivity and nanometric resolution or performing fast spectroscopy combined with microscopy at the microscale. We can correlate the nanoscale structure of materials with their chemical and elemental composition, obtained with spectroscopic techniques, in particular with X-rays Photoelectron Spectroscopy (XPS).
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